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FREE ONLINE SEMINAR

RF Device Testing Using Synchronized Pulsed -DC and -RF Signals

Seminar Content

This seminar covers the fundamental concepts for measuring DC and RF characteristics of RF devices using pulsed -DC and -RF techniques. It is more practical than theoretical and is based on customer applications for which Keithley Instruments has developed solutions. A high-power 4H silicon carbide BJT is used as a test device example, and the applicability to MOSFET devices and RFIC amplifiers is discussed. A test system solution is shown with implementation techniques used to synchronize the bias and RF signals and measurements. The presentation demonstrates how accurate DC and RF measurements can be made using these pulsed-signal techniques with short pulse widths and low duty cycles. Practical measurement tips making good measurements are also given.

About the Presenter: Ron Rausch is a Marketing Manager at Keithley Instruments in the Wireless and RF Communications Products Group. He has over 20 years of experience in marketing and applications of RF and microwave test and measurement instrumentation, systems, and software. He’s worked on solutions for challenging applications in the wireless telecoms, RF communications, aerospace, and defense industries. Ron is currently in Santa Rosa, California at Keithley’s RF Design Center.

When is it?

Europe:
Tuesday, January 23, 2007
15:00 Central European Time (UTC/GMT: 14:00)

How Do I Register?

There is NO CHARGE for you to participate in this important industry event. Participants who attend this event and complete the survey (sent after the seminar) will also receive Keithley’s “Speaking RF: Wireless Communication Terminology", a guide to understanding the vocabulary of the wireless industry.

To register for this webcast seminar click here.

http://www.quipoo.de/redirect/keithley.asp...&ceid=69530