Цитата(Degtyarev @ Sep 26 2013, 23:26)

Да и вообщем-то задержку я бы делал с запасом, лишнее время только понизит немного кпд, да и и только.
Вот только mosfet не слышат ваших заклинаний...
"The longer the ZVS dead-time, the more charge can be accumulated in the free-wheeling diode device, whatever its construction.
In the case of the free-wheeling diode being a MOSFET body-diode, the recovery can be labored and potentially hazardous to the device being recovered.
Dynamic avalanche may be seen at high rates of recovery that can result in catastrophic failure.
A parasitic bipolar junction transistor (BJT) within the MOSFET can be enabled and its lack of safe-operating-area and sufficient breakdown voltage can precede microscopic hot-spot induced failure within the MOSFET.
High temperature can aggravate the matter by increasing a stored charge, reducing the base-emitter voltage threshold of turn-on in the BJT, and/or reducing the thermal margins for the hot-spot formation process.
In general, the less time the output stage switch sees in a reverse current flow mode without being turned-on, the less stored charge can be accumulated in a free-wheeling diode of any form.
(Minority-carrier mechanisms being the least well behaved.)
For example, a MOSFET is just as conductive in its controlled majority-carrier channel during reverse main-terminal operating conditions as it is when the main-terminals are normally biased (forward current).
When so enabled it appears as two devices in parallel, a MOSFET and a diode.
The lower the resistance of the MOSFET, the more of the current is diverted from flowing through the diode.
In some situations the result of having the majority-carrier channel normally biased may be more than a simple current diversion and may sometimes also result in the physical distribution of charge within the MOSFET being more desirable when the majority-carrier current flows are active."
В них всё с точностью наоборот !